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KMID : 0381920080380010051
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Korean Journal of Microscopy
2008 Volume.38 No. 1 p.51 ~ p.61
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Model Simulation for Assessment of Image Acquisition Errors Affecting Electron Tomography
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Jou Hyeong-Tae
Kim Youn-Joong
Lee Su-Jeong
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Abstract
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This simulation study examined the effect of data acquisition error including the data type of TEM image, and incident beam intensity of the tilt series on 3D tomograms. Simulation was performed with the 3D head phantom model of Kak and Slaney, and the slightly modified 3D head phantom model with enhanced difference in absorption coefficients. Reconstructed tomogram for the original head phantom model using 8-bit gray-scale image was distorted with extremely high level of noise, while an acceptable result was obtained for the modified model. The results for the original model using wrong formulation for the transmitted beam intensity was proved to be incorrect. The high level of noise along the z direction was found in case of the modified model. On the other hand, the wrong value of incident beam intensity in both models gave distorted results. In order to reconstruct an artifacts-free 3D structure from the projections with invisible features in electron tomography, the 16-bit projection images should be used with the correct incident beam intensity which is applied to Beer’s law.
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KEYWORD
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Electron tomography, Model simulation, 3D head phantom, Acquisition error
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